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| HTS CodeCode | Description | General RateGeneral | Special RateSpecial | Other | Units |
|---|---|---|---|---|---|
9031.41.00 | For inspecting semiconductor wafers or devices (including integrated circuits) or for inspecting photomasks or reticles used in manufacturing semiconductor devices (including integrated circuits) | Free | - | 50% | - |
9031.41.0020 | For inspecting photomasks or reticles used in manufacturing semiconductor devices | - | - | - | No. |
9031.41.0040 | For wafers | - | - | - | No. |
9031.41.0060 | Other | - | - | - | No. |
9031.49.1000 | Profile projectors | Free | - | 45% | No. |
9031.49.4000 | Coordinate-measuring machines | Free | - | 50% | No. |
9031.49.7000 | For inspecting masks (other than photomasks) used in manufacturing semiconductor devices; for measuring surface particulate contamination on semiconductor devices | Free | - | 50% | No. |
9031.49.9000 | Other | Free | - | 50% | No. |
9031.80.4000 | Electron beam microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles | Free | - | 40% | No. |
9031.80.80 | Other | Free | - | 40% | - |
9031.80.8060 | For testing electrical characteristics | - | - | - | kg |
9031.80.8070 | Other | - | - | - | kg |
9031.80.8085 | Other | - | - | - | kg |
9031.90.2100 | Of profile projectors | Free | - | 45% | kg |
9031.90.4500 | Bases and frames for the coordinate-measuring machines of subheading 9031.49.40 | Free | - | 50% | kg |